Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing, 37)
Product details
| Management number | 233378530 | Release Date | 2026/06/27 | List Price | US$39.21 | Model Number | 233378530 | ||
|---|---|---|---|---|---|---|---|---|---|
| Category | |||||||||
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. Read more
| ISBN10 | 038774746X |
|---|---|
| ISBN13 | 978-0387747460 |
| Edition | 2008th |
| Language | English |
| Publisher | Springer |
| Dimensions | 6.1 x 1.1 x 9.55 inches |
| Item Weight | 1.8 pounds |
| Print length | 420 pages |
| Part of series | Frontiers in Electronic Testing |
| Publication date | December 10, 2007 |
Bestseller ranking
Design
Customers who viewed this product also viewed
General
Correction of product information
If you notice any omissions or errors in the product information on this page, please use the correction request form below.
Correction Request Form